Semiconductor device having fin-type patterns

ABSTRACT

A semiconductor device is provided. The semiconductor device includes a substrate comprising first and second regions, in the first region, first and second gate electrodes formed parallel to each other on the substrate, and being spaced apart from each other by a first distance, in the second region, third and fourth gate electrodes formed parallel to each other on the substrate, and being spaced apart from each other by a second distance which is greater than the first distance, in the first region, a first recess formed on the substrate between the first and second gate electrodes, in the second region, a second recess formed on the substrate between the third and fourth gate electrodes, a first epitaxial source/drain filling the first recess and a second epitaxial source/drain filling the second recess, wherein an uppermost portion of an upper surface of the first epitaxial source/drain is higher than an uppermost portion of an upper surface of the second epitaxial source/drain.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority to Korean Patent Application No.10-2015-0171393 filed on Dec. 3, 2015, and Korean Patent Application No.10-2016-0010593 filed on Jan. 28, 2016, in the Korean IntellectualProperty Office, and all the benefits accruing therefrom under 35 U.S.C.119, the contents of which in its entirety are herein incorporated byreference.

BACKGROUND

1. Technical Field

The present disclosure relates to a semiconductor device.

2. Description of the Related Art

As one of scaling technologies to increase the density of semiconductordevices, a multi-gate transistor has been suggested, in which siliconbodies in a fin or nanowire shape are formed on a substrate, with gatesthen being formed on surfaces of the silicon bodies.

Such a multi-gate transistor allows easy scaling, as it uses athree-dimensional channel. Further, current control capability can beenhanced without increasing gate length of the multi-gate transistor.Furthermore, it is possible to effectively suppress short channel effect(SCE) which is a phenomenon that the electric potential of the channelregion is influenced by the drain voltage.

SUMMARY

It is one technical object of the present disclosure to provide asemiconductor device with improved operating characteristics.

The objects according to the present disclosure are not limited to thoseset forth above and objects other than those set forth above will beclearly understood to a person skilled in the art from the followingdescription.

According to an aspect of the present inventive concept, there isprovided a semiconductor device, comprising a substrate comprising firstand second regions, in the first region, first and second gateelectrodes extending parallel to each other on the substrate, and beingspaced apart from each other by a first distance, in the second region,third and fourth gate electrodes extending parallel to each other on thesubstrate, and being spaced apart from each other by a second distancewhich is greater than the first distance, in the first region, a firstrecess formed on the substrate between the first and second gateelectrodes, in the second region, a second recess formed on thesubstrate between the third and fourth gate electrodes, a firstepitaxial source/drain filling the first recess and a second epitaxialsource/drain filling the second recess, wherein an uppermost portion ofan upper surface of the first epitaxial source/drain is higher than anuppermost portion of an upper surface of the second epitaxialsource/drain.

According to another aspect of the present inventive concept, there isprovided a semiconductor device, comprising a substrate comprising firstto fourth regions, in the first region, first and second gate electrodesextending parallel to each other on the substrate, and being spacedapart from each other by a first distance, in the second region, thirdand fourth gate electrodes extending parallel to each other on thesubstrate, and being spaced apart from each other by a second distancewhich is different from the first distance, in the third region, fifthand sixth gate electrodes extending parallel to each other on thesubstrate, and being spaced apart from each other by the first distance,in the fourth region, seventh and eighth gate electrodes extendingparallel to each other on the substrate, and being spaced apart fromeach other by the second distance, in the first region, a first recessformed on the substrate between the first and second gate electrodes, inthe second region, a second recess formed on the substrate between thethird and fourth gate electrodes, in the third region, a third recessformed on the substrate between the fifth and sixth gate electrodes, inthe fourth region, a fourth recess formed on the substrate between theseventh and eighth gate electrodes and first to fourth epitaxialsource/drains filling the first to fourth recesses, respectively,wherein heights of upper surfaces of the first and second epitaxialsource/drains are different from each other, and heights of uppersurfaces of the third and fourth epitaxial source/drains are equal toeach other.

According to still another aspect of the present inventive concept,there is provided a semiconductor device, comprising a substratecomprising first and second regions, in the first and second regions,first and second fin-type patterns protruding from the substrate,respectively, a first gate electrode intersecting the first fin-typepattern on the first fin-type pattern, a second gate electrodeintersecting the second fin-type pattern on the second fin-type pattern,a first epitaxial source/drain formed on either side of the first gateelectrode and a second epitaxial source/drain formed on either side ofthe second gate electrode, wherein a width of the first epitaxialsource/drain is less than that of the second epitaxial source/drain, andan upper surface of the first epitaxial source/drain is higher than anupper surface of the second epitaxial source/drain.

According to still another aspect of the present inventive concept,there is provided a semiconductor device, comprising a substratecomprising first to third regions, first to third gate electrodes formedin the first to third regions, respectively, a first epitaxialsource/drain formed on either side of the first gate electrode, a secondepitaxial source/drain formed on either side of the second gateelectrode and a third epitaxial source/drain formed on either side ofthe third gate electrode, wherein a width of the first epitaxialsource/drain is less than that of the second epitaxial source/drain, awidth of the second epitaxial source/drain is less than that of thethird epitaxial source/drain, an upper surface of the first epitaxialsource/drain is higher than an upper surface of the second epitaxialsource/drain, and an upper surface of the second epitaxial source/drainis higher than an upper surface of the third epitaxial source/drain.

According to an embodiment of the present disclosure, a semiconductordevice comprises a substrate comprising a first and a second fin-typeactive patterns, a first and a second gate electrodes formed on thefirst and second fin-type active patterns respectively, a firstsource/drain pattern formed between the first and second fin-type activepatterns, gate insulator layers formed between the first and second gateelectrodes and the first and second fin-type active patternsrespectively, and gate spacers formed between the first and second gateelectrodes and the first source/drain pattern, wherein the centerportion of the top surface of the first source/drain pattern is lowerthan edge portions of the top surface of the first source/drain pattern,wherein a depth of the center portion of the first source/drain patternis less than 60% and more than 10% of the height of the firstsource/drain pattern, wherein the height of the first source/drainpattern is a vertical distance between a lowest point of the lowersurface of the first source/drain pattern and a highest point of theupper surface of the first source/drain pattern in a cross-sectionalview, wherein the depth of the center portion is a vertical distancebetween a lowest point of the center portion of the upper surface of thefirst source/drain pattern and a highest point of the upper surface ofthe first source/drain pattern in a cross-sectional view.

According to an embodiment of the present disclosure, a semiconductordevice comprises a first and a second fin-type active patterns formed ona substrate, a first and a second gate electrodes formed on the firstand second fin-type active patterns respectively, a first source/drainpattern formed between the first and second fin-type active patterns,gate insulator layers formed between the first and second gateelectrodes and the first and second fin-type active patternsrespectively, and gate spacers formed between the first and second gateelectrodes and the first source/drain pattern, wherein the centerportion of the top surface of the first source/drain pattern is higherthan edge portions of the top surface of the first source/drain pattern,wherein a height of the first fin-type active pattern is between 50% and90% of a height of the first source/drain pattern, wherein the height ofthe first source/drain pattern is a vertical distance between a lowestpoint of the lower surface of the first source/drain pattern and ahighest point of the upper surface of the first source/drain pattern ina cross-sectional view, wherein the height of the first fin-type activepattern is a vertical distance between a lowest point of the lowersurface of the first source/drain pattern and a highest point of anupper surface of the first source/drain pattern in a cross-sectionalview.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other objects, features and advantages of the presentdisclosure will become more apparent to those of ordinary skill in theart by describing in detail exemplary embodiments thereof with referenceto the accompanying drawings, in which:

FIG. 1 is a layout diagram provided to explain a semiconductor deviceaccording to some exemplary embodiments;

FIG. 2 are cross sectional views taken on lines A-A′ and B-B′ of FIG. 1;

FIG. 3 is a cross sectional view taken on line C-C′ of FIG. 1;

FIG. 4 is a cross sectional view taken on line D-D′ of FIG. 1;

FIG. 5 is a layout diagram provided to explain a semiconductor deviceaccording to some exemplary embodiments;

FIG. 6 are cross sectional views taken on lines A-A′ and B-B′ of FIG. 5;

FIG. 7 is a layout diagram provided to explain a semiconductor deviceaccording to some exemplary embodiments;

FIG. 8 are cross sectional views taken on lines A-A′ and B-B′ of FIG. 7;

FIG. 9 are comparative cross sectional views provided to explain asemiconductor device according to some exemplary embodiments;

FIG. 10 are comparative cross sectional views provided to explain asemiconductor device according to some exemplary embodiments;

FIG. 11 are cross sectional views provided to explain a semiconductordevice according to some exemplary embodiments.

FIG. 12 are cross sectional views provided to explain a semiconductordevice according to some exemplary embodiments;

FIG. 13 are cross sectional views provided to explain a semiconductordevice according to some exemplary embodiments;

FIG. 14 is an enlarged cross sectional view provided to explain asemiconductor device according to some exemplary embodiments;

FIG. 15 is an enlarged cross sectional view provided to explain asemiconductor device according to some exemplary embodiments;

FIG. 16 are cross sectional views provided to explain a semiconductordevice according to some exemplary embodiments;

FIG. 17 is an enlarged view provided to explain a shape of the silicidein the second region of FIG. 16;

FIG. 18 is an enlarged view provided to explain a shape of the silicidein the fourth region of FIG. 16;

FIG. 19 is an enlarged view provided to explain a shape of the silicidein the sixth region of FIG. 16;

FIG. 20 is a block diagram of a system-on-chip (SoC) system including asemiconductor device according to a semiconductor device fabricatingmethod according to exemplary embodiments; and

FIG. 21 is a block diagram of an electronic system including asemiconductor device according to a semiconductor device fabricatingmethod according to exemplary embodiments.

DETAILED DESCRIPTION

Aspects of example embodiments of the present inventive concept will nowbe described more fully hereinafter with reference to the accompanyingdrawings. This invention may, however, be embodied in different formsand should not be construed as limited to the embodiments set forthherein. Rather, these example embodiments are just that—examples—andmany implementations and variations are possible that do not require thedetails provided herein. It should also be emphasized that thedisclosure provides details of alternative examples, but such listing ofalternatives is not exhaustive. Furthermore, any consistency of detailbetween various examples should not be interpreted as requiring suchdetail—it is impracticable to list every possible variation for everyfeature described herein. The language of the claims should bereferenced in determining the requirements of the invention. The samereference numbers indicate the same components throughout thespecification. In the attached figures, the thickness of layers andregions may be exaggerated for clarity.

It will be understood that when an element or layer is referred to asbeing “connected to,” or “coupled to” another element or layer, it canbe directly connected to or coupled to another element or layer orintervening elements or layers may be present. In contrast, when anelement is referred to as being “directly connected to” or “directlycoupled to” another element or layer, there are no intervening elementsor layers present. Like numbers refer to like elements throughout. Asused herein, the term “and/or” includes any and all combinations of oneor more of the associated listed items.

It will also be understood that when a layer is referred to as being“on” another layer or substrate, it can be directly on the other layeror substrate, or intervening layers may also be present. In contrast,when an element is referred to as being “directly on” another element,there are no intervening elements present.

It will be understood that, although the terms first, second, etc. maybe used herein to describe various elements, these elements should notbe limited by these terms. These terms are only used to distinguish oneelement from another element. Thus, for example, a first element, afirst component or a first section discussed below could be termed asecond element, a second component or a second section without departingfrom the teachings of the present inventive concept.

The use of the terms “a” and “an” and “the” and similar referents in thecontext of describing the invention (especially in the context of thefollowing claims) are to be construed to cover both the singular and theplural, unless otherwise indicated herein or clearly contradicted bycontext. The terms “comprising,” “having,” “including,” and “containing”are to be construed as open-ended terms (i.e., meaning “including, butnot limited to,”) unless otherwise noted.

Unless defined otherwise, all technical and scientific terms used hereinhave the same meaning as commonly understood by one of ordinary skill inthe art to which this invention belongs. It is noted that the use of anyand all examples, or exemplary terms provided herein is intended merelyto better illuminate the invention and is not a limitation on the scopeof the invention unless otherwise specified. Further, unless definedotherwise, all terms defined in generally used dictionaries may not beoverly interpreted.

Hereinbelow, a semiconductor device according to some exemplaryembodiments will be described with reference to FIGS. 1 to 10.

FIG. 1 is a layout diagram provided to explain a semiconductor deviceaccording to some exemplary embodiments, and FIG. 2 are cross sectionalviews taken on lines A-A′ and B-B′ of FIG. 1. FIG. 3 is a crosssectional view taken on line C-C′ of FIG. 1, and FIG. 4 is a crosssectional view taken on line D-D′ of FIG. 1. FIG. 5 is a layout diagramprovided to explain a semiconductor device according to some exemplaryembodiments, and FIG. 6 are cross sectional views taken on lines A-A′and B-B′ of FIG. 5. FIG. 7 is a layout diagram provided to explain asemiconductor device according to some exemplary embodiments, and FIG. 8are cross sectional views taken on lines A-A′ and B-B′ of FIG. 7. FIG. 9are comparative cross sectional views provided to explain asemiconductor device according to some exemplary embodiments, and FIG.10 are comparative cross sectional views provided to explain asemiconductor device according to some exemplary embodiments.

For convenience of explanation, FIGS. 1, 5, and 7 each are layouts ofthe first region I to the sixth region VI. Further, FIGS. 2 to 4, 6, and8 each are cross sectional views of FIGS. 1, 5, and 7. In addition, forcomparison to each regions, FIG. 9 shows comparative cross sectionalviews of the first region I, the third region III, and the fifth regionV, and FIG. 10 shows comparative cross sectional views of the secondregion II, the fourth region IV, and the sixth region VI.

First, referring to FIGS. 1 to 4, a semiconductor device according tosome exemplary embodiments may include a substrate 10, a first fin-typepattern F1, a second fin-type pattern F2, first to sixth shallowtrenches ST1-ST6, first to third trenches T1-T3, a first interlayerinsulating film 20, a second interlayer insulating film 30, a first gateelectrode 200, a second gate electrode 300, a third gate electrode 201,a fourth gate electrode 301, gate insulating films 130 and 140, a gatespacer 160, a first source/drain E1, a second source/drain E2, and soon.

The substrate 10 may be, for example, a bulk silicon or asilicon-on-insulator (SOI). Alternatively, the substrate 10 may be asilicon substrate, or may include other material such as silicongermanium, indium antimonide, lead telluride compound, indium arsenide,indium phosphide, gallium arsenide, or gallium antimonide.Alternatively, the substrate 10 may be a base substrate having anepitaxial layer formed thereon.

The substrate 10 may include a first region I and a second region II.The first region I and the second region II may be the regions adjacentto each other, or spaced apart from each other. Accordingly, the firstfin-type pattern F1 in the first region I and the second fin-typepattern F2 in the second region II may extend in different directionsfrom each other. However, for convenience of explanation, it will beexplained herein that the first fin-type pattern F1 in the first regionI and the second fin-type pattern F2 in the second region II extend inthe same directions as each other.

Different conductivity types of transistors may be formed in the firstregion I and the second region II. For example, the first region I maybe a region where a PMOS is formed, and the second region II may be aregion where an NMOS is formed, although exemplary embodiments are notlimited thereto.

The first region I and the second region II may be defined by a firsttrench T1, a second trench T2, and a third trench T3. The first trenchT1 may have first and second side surfaces opposite of each other. Thefirst trench T1 may be in contact with the first region I at the firstside surface, and may be in contact with the second region II at thesecond side surface.

The first region I may include a first active region ACT1, and thesecond region II may include a second active region ACT2. The firstactive region ACT1 and the second active region ACT2 may be adjacent toeach other, or spaced apart from each other.

The second trench T2 may be in contact with the first region I. Forexample, the first region I may be located between the first trench T1and the second trench T2. The third trench T3 may be in contact with thesecond region II. For example, the second region II may be locatedbetween the first trench T1 and the second trench T2.

Referring to FIG. 1, the first fin-type pattern F1 and the secondfin-type pattern F2 may extend longitudinally in a first direction X. Asillustrated in FIG. 1, the first fin-type pattern F1 and the secondfin-type pattern F2 may have a rectangular shape, although exemplaryembodiments are not limited thereto. If the first fin-type pattern F1and the second fin-type pattern F2 are in the rectangular shape, thefirst fin-type pattern F1 and the second fin-type pattern F2 may includelong sides extending in the first direction X and short sides extendingin a second direction Y. In this case, the second direction Y may be thedirection that is not parallel to, but intersects the first direction X.

The first fin-type pattern F1 may be plural, and the first fin-typepatterns F1 may be spaced apart from one another in the second directionY. The second fin-type pattern F2 may be plural, and the second fin-typepatterns F2 may be spaced apart from one another in the second directionY.

A plurality of first fin-type patterns F1 may be defined by the first tothird shallow trenches ST1-ST3. Further, a plurality of second fin-typepatterns F2 may be defined by the fourth to sixth shallow trenchesST4-ST6. For example, in the first region I, the first fin-type patternsF1 are defined by the first trench T1, the second trench T2, and thefirst to third shallow trenches ST1-ST3, and in the second region II,the second fin-type patterns F2 are defined by the first trench T1, thethird trench T3, and the fourth to sixth shallow trenches ST4-ST6.

A depth of the first to sixth shallow trenches ST1-ST6 may be less thanor equal to that of the first to third trenches T1-T3. However, a widthof the first to sixth shallow trenches ST1-ST6 may be less than that ofthe first to third trenches T1-T3. Accordingly, a volume of the firstinterlayer insulating film 20 formed in the first to third trenchesT1-T3 may be greater than that of the first interlayer insulating film20 formed in the first to sixth shallow trenches ST1-ST6.

The first fin-type patterns F1 and the second fin-type patterns F2 maybe formed by etching a portion of the substrate 10, and may include anepitaxial layer grown from the substrate 10. The first fin-type patternsF1 and the second fin-type patterns F2 may include an elementsemiconductor material such as silicon or germanium, for example. Thefirst fin-type patterns F1 and the second fin-type patterns F2 mayinclude a compound semiconductor such as, for example, Iv-Iv groupcompound semiconductor or III-V group compound semiconductor.

For example, in case the first and second fin-type patterns F1 and F2are a IV-IV group compound semiconductor, the first fin-type patterns F1and the second fin-type patterns F2 may be a binary compound or aternary compound including at least two or more of carbon (C), silicon(Si), germanium (Ge) or tin (Sn), or these compounds doped with IV groupelement.

In case the first and second fin-type patterns F1 and F2 are a III-Vgroup compound semiconductor for instance, the first fin-type patternsF1 and the second fin-type patterns F2 may be one of a binary compound,a ternary compound or a quaternary compound which is formed by acombination of a group III element and a group V element. The group IIIelement may be at least one of aluminum (Al), gallium (Ga), and indium(In), and the group V element may be one of phosphorus (P), arsenic (As)and antimony (Sb).

In the semiconductor devices according to exemplary embodiments, thefirst fin-type patterns F1 and the second fin-type patterns F2 mayinclude silicon.

The first interlayer insulating film 20 may partially fill the first tosixth shallow trenches ST1-ST6 and the first to third trenches T1-T3.The first interlayer insulating film 20 may partially surround sidesurfaces of the first and second fin-type patterns F1 and F2.

For example, the first interlayer insulating film 20 may include atleast one of silicon oxide, silicon nitride, silicon oxynitride, and alow-k dielectric material with a smaller dielectric constant thansilicon oxide. For example, the low-k dielectric material may includeflowable oxide (FOX), tonen silazene (TOSZ), undoped silica glass (USG),borosilica glass (BSG), phosphosilica glass (PSG), borophosphosilicaglass (BPSG), plasma enhanced tetraethyl orthosilicate (PETEOS),fluoride silicate glass (FSG), carbon doped silicon oxide (CDO),xerogel, aerogel, amorphous fluorinated carbon, organo silicate glass(OSG), parylene, bis-benzocyclobutenes (BCB), SILK, polyimide, porouspolymeric material, or a combination thereof, but not limited thereto.

The first interlayer insulating film 20 may have a specific stresscharacteristic. For example, the first interlayer insulating film 20 mayhave a tensile stress characteristic as its volume is shrunken by a heattreatment after deposition. A slope of the first and second fin-typepatterns F1 and F2 may be determined by the tensile stresscharacteristic of the first interlayer insulating film 20, according toa volume of the first interlayer insulating film 20. For example, whenthe volumes of the first interlayer insulating film 20 on both sidesurfaces are different from each other, the fin-type patterns mayincline. For example, the fin-type patterns may incline more as thedifference of the volumes of the first interlayer insulating film 20increases between both sides of the fin-type patterns. For example, in amathematical terms, the slope of a fin-type pattern may decrease as thedifference of the volumes of the first interlayer insulation filmincrease between both sides of the fin-type pattern with respective to ahorizontal direction corresponding to an extending direction of thesubstrate 10 (e.g. XY plane of FIG. 1). This is because the shrink rateof the first interlayer insulating film 20 of larger volume is largerthan the shrink rate of the first interlayer insulating film 20 ofsmaller volume. For example, the first interlayer insulating film 20 ofa larger volume shrinks more than the first interlayer insulating film20 of smaller volume.

For example, the first fin-type patterns F1 being in direct contact withthe first trench T1 and the second trench T2 may be inclined toward thefirst trench T1 and the second trench T2, respectively.

For example, the angles of the first fin-type patterns F1 being indirect contact with the first trench T1 and the second trench T2 arerespectively a first angle θ1 and a second angle θ2 toward therespective first and second trenches T1 and T2 with respect to avertical direction which is perpendicular to the XY plane of FIG. 1.

The second fin-type patterns F2 being in direct contact with the firsttrench T1 and the third trench T3 may be inclined toward the firsttrench T1 and the third trench T3, respectively.

For example, the angles of the second fin-type patterns F2 being indirect contact with the respective first and third trenches T1 and T3are respectively a third angle θ3 and a fourth angle θ4 with respect tothe vertical direction.

The first to fourth angles θ1-θ4 may be acute angles. For example, thefirst fin-type patterns F1 and the second fin-type patterns F2 may beinclined by an acute angle toward the larger trenches.

The first gate electrode 200 and the second gate electrode 300 mayextend parallel to each other. The first gate electrode 200 and thesecond gate electrode 300 may extend in the second direction Y. Thefirst gate electrode 200 and the second gate electrode 300 may be spacedapart from each other in the first direction X. The first gate electrode200 may be spaced apart from the second gate electrode 300 by a firstdistance D1.

The third gate electrode 201 and the fourth gate electrode 301 mayextend parallel to each other. The third gate electrode 201 and thefourth gate electrode 301 may extend in the second direction Y. Thethird gate electrode 201 and the fourth gate electrode 301 may be spacedapart from each other in the first direction X. The third gate electrode201 may be spaced apart from the fourth gate electrode 301 by the firstdistance D1. For example, the spacing distances between two gateelectrodes may be identical in the first region I and the second regionII.

The first gate electrode 200 and the third gate electrode 201 may extendin the second direction Y. The first gate electrode 200 may intersectthe respective first fin-type patterns F1. For example, the first gateelectrode 200 may include portions overlapping with the plurality ofspaced-apart first fin-type patterns F1. The first fin-type patterns F1may respectively include a portion overlapping and another portionnon-overlapping with the first gate electrode 200.

The third gate electrode 201 may intersect the respective secondfin-type patterns F2. For example, the third gate electrode 201 mayinclude portions overlapping with the plurality of spaced-apart secondfin-type patterns F2. The second fin-type patterns F2 may respectivelyinclude a portion overlapping and another portion non-overlapping withthe third gate electrode 201.

The second gate electrode 300 and the fourth gate electrode 301 mayextend in the second direction Y. The second gate electrode 300 mayintersect the respective first fin-type patterns F1. For example, thesecond gate electrode 300 may include portions overlapping with theplurality of spaced-apart first fin-type patterns F1. The first fin-typepatterns F1 may respectively include a portion overlapping and anotherportion non-overlapping with the second gate electrode 300.

The fourth gate electrode 301 may intersect the respective secondfin-type patterns F2. For example, the fourth gate electrode 301 mayinclude portions overlapping with the plurality of spaced-apart secondfin-type patterns F2. The second fin-type patterns F2 may respectivelyinclude a portion overlapping and another portion non-overlapping withthe fourth gate electrode 301.

The first gate electrode 200 and the third gate electrode 201 may or maynot be connected with each other. Likewise, the second gate electrode300 and the fourth gate electrode 301 may or may not be connected witheach other.

Referring to FIGS. 2 and 3, the first gate electrode 200 may include afirst work function metal 210 and a first filling metal 220. The firstwork function metal 210 plays a role of adjusting a work function, andthe first filling metal 220 plays a role of filling the space formed bythe first work function metal 210. The first work function metal 210 maybe, for example, an N-type work function metal, a P-type work functionmetal, or a combination thereof.

The second gate electrode 300 may include a second work function metal310 and a second filling metal 320. The second work function metal 310plays a role of adjusting a work function, and the second filling metal320 plays a role of filling the space formed by the second work functionmetal 310. The second work function metal 310 may be, for example, anN-type work function metal, a P-type work function metal, or acombination thereof.

In some exemplary embodiments, the first region I may be a PMOS region,and therefore the first work function metal 210 and the second workfunction metal 310 may be a combination of an N-type work function metaland a P-type work function metal. For example, the first work functionmetal 210 and the second work function metal 310 may include at leastone of TiN, WN, TiAl, TiAlN, TaN, TiC, TaC, TaCN, TaSiN, or acombination thereof, but not limited thereto. The first filling metal220 and the second filling metal 320 may include, for example, at leastone of W, Al, Cu, Co, Ti, Ta, poly-Si, SiGe, or a metal alloy, but notlimited thereto.

The third gate electrode 201 may include a third work function metal 211and a third filling metal 221. The third work function metal 211 plays arole of adjusting a work function, and the third filling metal 221 playsa role of filling the space formed by the third work function metal 211.The third work function metal 211 may be, for example, an N-type workfunction metal, a P-type work function metal, or a combination thereof.

The fourth electrode 301 may include a fourth work function metal 311and a fourth filling metal 321. The fourth work function metal 311 playsa role of adjusting a work function, and the fourth filling metal 321plays a role of filling the space formed by the fourth work functionmetal 311. The fourth work function metal 311 may be, for example, anN-type work function metal, a P-type work function metal, or acombination thereof.

In some exemplary embodiments, the second region II may be an NMOSregion, and therefore the third work function metal 211 and the fourthwork function metal 311 may be an N-type work function metal. The thirdwork function metal 211 and the fourth work function metal 311 mayinclude, for example, at least one of TiN, WN, TiAl, TiAlN, TaN, TiC,TaC, TaCN, TaSiN, or a combination thereof, but not limited thereto. Thethird filling metal 221 and the fourth filling metal 321 may include,for example, at least one of W, Al, Cu, Co, Ti, Ta, poly-Si, SiGe, or ametal alloy, but not limited thereto.

For example, the first gate electrode 200, the second gate electrode300, the third gate electrode 201, and the fourth gate electrode 301 maybe formed by a replacement process or a gate last process, but notlimited thereto.

The gate insulating films 130 and 140 may be formed between the firstand second fin-type patterns F1 and F2 and the first and third gateelectrodes 200 and 201 respectively, and between the first interlayerinsulating film 20 and the respective first and third gate electrodes200 and 201.

The gate insulating films 130 and 140 may be formed between the firstand second fin-type patterns F1 and F2 and the second and fourth gateelectrodes 300 and 301 respectively, and between the first interlayerinsulating film 20 and the respective second and fourth gate electrodes300 and 301.

The gate insulating films 130 and 140 may include an interfacial film130 and a high-k dielectric film 140.

The interfacial film 130 may be formed by oxidizing portions of thefirst fin-type patterns F1 and the second fin-type patterns F2. Theinterfacial film 130 may be formed along a profile of the first fin-typepatterns F1 and the second fin-type patterns F2 protruding upward froman upper surface of the first interlayer insulating film 20. Forexample, the interfacial film 130 may be formed conformally on the firstand second fin-type patterns F1 and F2. When the first fin-type patternsF1 and the second fin-type patterns F2 are silicon fin-type patternsincluding silicon, the interfacial film 130 may include a silicon oxidefilm.

As illustrated in FIG. 3, the interfacial film 130 may not be formedalong the upper surface of the first interlayer insulating film 20, butexemplary embodiments are not limited thereto. Depending on methods offorming the interfacial film 130, the interfacial film 130 may be formedalong the upper surface of the first interlayer insulating film 20.

Alternatively, even when the first interlayer insulating film 20includes silicon oxide, when the silicon oxide included in the firstinterlayer insulating film 20 has different properties from the siliconoxide film included in the interfacial film 130, the interfacial film130 may be formed along the upper surface of the first interlayerinsulating film 20.

The high-k dielectric film 140 may be formed between the interfacialfilm 130 and the respective first, second, third and fourth gateelectrodes 200, 300, 201 and 301. It may be formed along the profile ofthe first fin-type patterns F1 and the second fin-type patterns F2protruding upward from the upper surface of the first interlayerinsulating film 20. For example, the high-k dielectric film 140 may beconformally formed on the first and second fin-type patterns F1 and F2and gate spacers 160. Further, the high-k dielectric film 140 may beformed between the respective first and second gate electrodes 200 and300 and the first interlayer insulating film 20, and between therespective third and fourth gate electrodes 201 and 301 and the firstinterlayer insulating film 20.

The high-k dielectric film 140 may include a high-k dielectric materialhaving a higher dielectric constant than silicon oxide film. Forexample, the high-k dielectric film 140 may include one or more ofsilicon oxynitride, silicon nitride, hafnium oxide, hafnium siliconoxide, lanthanum oxide, lanthanum aluminum oxide, zirconium oxide,zirconium silicon oxide, tantalum oxide, titanium oxide, bariumstrontium titanium oxide, barium titanium oxide, strontium titaniumoxide, yttrium oxide, aluminum oxide, lead scandium tantalum oxide, orlead zinc niobate, but not limited thereto.

A gate spacer 160 may be disposed on a sidewall of the first to fourthgate electrodes 200, 201, 300 and 301 extending in the second directionY. The gate spacer 160 may include, for example, at least one of siliconnitride (SiN), silicon oxynitride (SiON), silicon oxide (SiO₂), siliconoxycarbonitride (SiOCN), and a combination thereof.

As illustrated in the drawings, the gate spacer 160 may be a single filmas an example, but it may be multiple spacers in which a plurality offilms are stacked. A shape of the gate spacer 160 and respective shapesof the multiple spacers forming the gate spacer 160 may be I- orL-shape, or a combination thereof depending on the fabrication processand use.

Referring to FIGS. 2 and 4, the first source/drain E1 may be formed oneither side of the first gate electrode 200 and second gate electrode300 in the first direction X, and on the respective first fin-typepatterns F1. The first source/drain E1 may be source/drain regions ofrespective transistors on the first fin-type patterns F1.

The second source/drain E2 may be formed on either side of the thirdgate electrode 201 and fourth gate electrode 301 in the first directionX, and on the respective second fin-type patterns F2. The secondsource/drain E2 may be source/drain regions of respective transistors onthe second fin-type patterns F2.

The first source/drain E1 and the second source/drain E2 may include anepitaxial layer formed by epitaxy. For example, the first source/drainE1 and/or the second source/drain E2 may be a raised source/drain. Thefirst region I may be a PMOS region and the second region II may be anNMOS region. For example, the first source/drain E1 may be a SiGeepitaxial layer. The second source/drain E2 may be a Si epitaxial layer,for example. At this time, the second source/drain E2 may include Si:Phighly doped with phosphorus P.

The first source/drain E1 may fill a recess F1 r of the first fin-typepatterns F1. Likewise, the second source/drain E2 may fill a recess F2 rof the second fin-type patterns F2. Accordingly, the first source/drainE1 and the second source/drain E2 may have a lower portion in a U-shapealong a bottom surface of the recesses F1 r and F2 r. In some exemplaryembodiments, the first source/drain E1 and the second source/drain E2may have a lower portion of W-shape or UU-shape having a series ofU-shapes according to a formation of the recesses F1 r and F2 r.

FIG. 2 are cross sectional views in the first direction X, and FIG. 4are cross sectional views in the second direction Y.

Referring first to FIG. 2, the first source/drain E1 in the first regionI may be formed so as to fill a recess F1 r formed on an upper surfaceof the first fin-type patterns F1. At this time, since a first gateelectrode 200 and a second gate electrode 300 are formed in the portionin which no recess F1 r is formed on the upper surface of the firstfin-type patterns F1, the first source/drain E1 may be formed betweenthe first gate electrode 200 and the second gate electrode 300.

The first source/drain E1 may have a same level of upper surface as thefirst fin-type patterns F1. For example, a height of an upper surface ofthe first source/drain E1 may be equal to a height of the upper surfaceof the first fin-type patterns F1. For example, the upper surface of thefirst source/drain E1 and the upper surface of an adjacent firstfin-type pattern F1 may be in the same level with respect to anextending surface of the substrate 10. For example, the height of thefirst source/drain E1 may be a vertical distance from the lowest pointof the first source/drain E1 to the highest point of the source/drainE1. Other heights of source/drains may be defined similarly. The heightof the first source/drain E1 may be between 25 nm and 45 nm. The heightof the first source/drain E1 may be between 30 nm and 40 nm. The uppersurface of the first source/drain E1 may be flat. For example, a heightof a highest point of the upper surface from a lowermost level of theupper surface may be less than 5 nm. A height discussed in thisdisclosure may be a vertical distance between two points, and thevertical distance is taken in a perpendicular direction to an extendingsurface of the substrate 10. A portion of the upper surface of the firstsource/drain E1 may be overlapped with a portion of a lower surface ofthe gate spacer 160. For example, a portion of the upper surface of thefirst source/drain E1 may be contact with a portion of a lower surfaceof the gate spacer 160.

The second source/drain E2 in the second region II may be formed so asto fill a recess F2 r formed on an upper surface of the second fin-typepatterns F2. At this time, since a third gate electrode 201 and a fourthgate electrode 301 are formed in the portion in which no recess F2 r isformed on the upper surface of the second fin-type patterns F2, thesecond source/drain E2 may be formed between the third gate electrode201 and the fourth gate electrode 301.

The second source/drain E2 may have a higher upper surface than those ofthe second fin-type patterns F2. For example, a height of an uppersurface of the second source/drain E2 may be greater than that of theupper surface of the second fin-type patterns F2. The upper surface ofthe second source/drain E2 may have a convex portion CV. A portion ofthe upper surface of the second source/drain E2 may be overlapped with aportion of the lower surface of the gate spacer 160. For example, aportion of the upper surface of the second source/drain E2 may be incontact with a portion of the lower surface of the gate spacer 160. Forexample, the height of the second source/drain E2 may be between 30 nmand 60 nm. The height of the second source/drain E2 may be between 40 nmand 50 nm.

The convex portion CV of the upper surface of the second source/drain E2may be formed convexly from the bottom surface of the recess F2 r formedin the second fin-type pattern F2 by a first height h1. The first heighth1 may be greater than a height h0 at which the upper surface of thefirst source/drain E1 is spaced apart from the bottom surface of therecess F1 r. For example, the first height h1 may be between 30 nm and60 nm. The first height h1 may be between 40 nm and 50 nm. For example,the ratio of h1 to h0 may be between 1.1:1 and 2:1. For example theratio of h1 to h0 may be between 1.2:1 and 1.5:1.

Referring to FIG. 4, an outer circumference of the first source/drain E1and the second source/drain E2 may have a variety of shapes. Forexample, the outer circumference of the first source/drain E1 and thesecond source/drain E2 may have at least one among diamond, circle, orrectangle shapes. FIG. 4 illustrates a diamond shape (or pentagon orhexagon shape) for example. Unless context indicates otherwise, shapesdescribed herein refer to a two dimensional shape of a particular crosssection or view (e.g., top view) of an element (e.g., fin, spacer,source/drain, etc.).

Since the semiconductor device according to an exemplary embodiment is aPMOS transistor in the first region I, the first source/drain E1 mayinclude a compressive stress material. For example, the compressivestress material may be a material such as SiGe that has a higher latticeconstant than Si. For example, the compressive stress material canenhance mobility of the carrier in the channel region by exertingcompressive stress on the first fin-type pattern F1 (e.g. the channelregion of the PMOS transistor).

When the semiconductor device according to an exemplary embodiment is anNMOS transistor in the second region II, the second source/drain E2 mayinclude a tensile stress material. For example, when the second fin-typepattern F2 is silicon, the second source/drain E2 may be a material(e.g., SiC) having a smaller lattice constant than the silicon. Forexample, the tensile stress material can enhance mobility of the carrierin the channel region by exerting tensile stress on the second fin-typepattern F2 (e.g. the channel region of the NMOS transistor).

Referring to FIG. 4, each of the first source/drain E1 and the secondsource/drain E2 in the first and second regions I and II may be in aconvex polygonal shape. As illustrated in FIG. 4, the convex polygonalshape may be pentagonal.

Cross sections of the first source/drains E1 may have convex polygonalshapes. In this case, cross sections of a plurality of firstsource/drains E1 may have the same shape as one another. The expression“the same” as used herein may include not only the completely same shapeand size as one another, but also the concept that includes differentlysized convex polygonal shapes having identical internal angles to eachother.

For example, the first source/drains E1 may each be in bilateralsymmetry. Each of the first source/drains E1 may include a lower regionand an upper region formed on the lower region, and the lower region mayhave an increasing width as its height increases, and the upper regionmay have a decreasing width as its height increases.

Each of the upper regions may include a first outer surface and a secondouter surface in symmetry with each other. Normal directions of thefirst outer surfaces may be the same as one another in the firstsource/drains E1. Normal directions of the second outer surfaces may bethe same as one another in the first source/drains E1.

A plurality of first source/drains E1 may have the same internal anglesas one another. In some exemplary embodiments, the internal angles mayindicate only the three internal angles of each first source/drain E1that are not in contact with the first fin-type patterns F1. Forexample, the three internal angles of a first source/drain E1 may have aconstant value according to the crystal orientation.

Since the first region I may be a PMOS region, the first source/drainsE1 may include SiGe, and its epitaxial growth may be carried out in astraight crystal orientation. Accordingly, cross sections of the firstsource/drains E1 may have the same shape as one another.

Referring to FIG. 4, each of the second source/drains E2 in the secondregion II may be in a convex polygonal shape. As illustrated in FIG. 4,the convex polygonal shape may be pentagonal. As used herein, the“convex polygonal shape” does not refer to only a figure having alwaysflat surfaces, as it includes curved surfaces connecting internalangles. The internal angles may have a shape having distinctcharacteristics. For example, the “convex polygonal shape” may include aconvex polygonal shape distorted by a manufacturing process. Forexample, as illustrated in FIG. 4, while “convex polygonal shape” asused herein may be characterized as having the example internal anglesas shown below, it may also have other internal angles than the exampleinternal angles, and a surface connecting each of the internal anglesmay not be a plane.

The second source/drains E2 may be in different shapes from each other.For example, the second source/drains E2 may have different internalangles from each other.

Because the second region II may be an NMOS region, the secondsource/drain E2 may include Si or Si:P, and its epitaxial growth may becarried out in a non-straight crystal orientation, unlike the firstregion I. Accordingly, a plurality of second source/drains E2 may havedifferent shapes from each other.

Each of the second source/drains E2 may include a lower region and anupper region formed on the lower region, and the lower region may havean increasing width as its height increases, and the upper region mayhave a decreasing width as its height increases.

In the second source/drains E2, each of the upper regions may include athird outer surface and a fourth outer surface in symmetry with eachother, and the normal directions of the third outer surfaces may bedifferent from one another in the second source/drains E2. Normaldirections of the fourth outer surfaces may be different from oneanother in the second source/drains E2.

A height of an interface in which the first source/drains E1 and thefirst fin-type patterns F1 meet in the first region I may be less thanthat of an interface in which the second source/drains E2 and the secondfin-type patterns F2 meet in the second region II. For example, theupper surfaces of the first source/drains E1 may be lower than the uppersurfaces of the second source/drains E2.

For example, a recessed depth of the first fin-type pattern F1 in thefirst region I is deeper than a recessed depth of the second-fin-typepattern F2 in the second region. In the first region I, total volumes ofthe first source/drains E1 may be determined according to the degree ofthe recess F1 r of the first fin-type pattern F1 because the shape ofthe first source/drain E1 is formed regularly. For example, the fin-typepatterns may become narrower as the distance increases from thesubstrate 10. For example, the width of the upper surface of therecessed fin-type pattern may become greater with increasing depth ofthe recess F1 r. For example, the total volume of each of the firstsource/drains E1 may be determined according to the width of the uppersurface of the exposed fin-type pattern since the first source/drain E1may be formed along the crystal orientation. For example, the width ofthe upper surface of the first source/drain E1 in a cross-sectional viewas shown in FIG. 2 may be between 20 nm and 50 nm. For example the widthof the upper surface of the first source/drain E1 in the cross-sectionalview may be between 30 nm and 40 nm. For example, the width of the uppersurface of the first source/drain E1 may be a distance between both endpoints of the upper surface in a cross-sectional view as shown in FIG.2.

In contrast, because a shape of the second source/drain E2 is irregularin the second region II, the width of the upper surface of the exposedfin-type pattern may not influence a volume of the second source/drainE2. For example, how long the second source/drain E2 has been grown maydetermine the volume of the second source/drain E2. Therefore, unlike inthe first region I, it may be beneficial to form a recess of thefin-type pattern shallow in the second region II. For example, a volumeof a second source/drain E2 may depend on the time that the secondsource/drain E2 has been grown. Accordingly, the height of the interfaceof the fin-type pattern and the epitaxial pattern in the first region Imay be lower than that of interface of the fin-type pattern and theepitaxial pattern in the second region II.

The upper surfaces of the second fin-type patterns F2 in the secondregion II may be higher than the upper surfaces of the first fin-typepatterns F1 in the first region I. As such, the width of the uppersurfaces of the second fin-type patterns F2 in the second region II maybe less than that of the upper surfaces of the first fin-type patternsF1 in the first region I. For example, the width of the upper surface ofthe second source/drain E2 in a cross-sectional view as shown in FIG. 2may be between 15 nm and 45 nm. For example the width of the uppersurface of the first source/drain E1 in the cross-sectional view may bebetween 27 nm and 37 nm.

Some of the second source/drains E2 in the second region II may be incontact with each other. For example, some of the second source/drainsE2 may be merged with neighboring second source/drains E2.

The first source/drains E1 in the first region I may not be in contactwith each other, but spaced apart from each other, respectively. Incontrast, at least one of the second source/drains E2 may be in contactwith each other. This is because a width of the second source/drain E2in the second region II may be grown greater than that of the firstsource/drains E1 in the first region I.

In a semiconductor device according to some exemplary embodiments, asportions of the second source/drains E2 are in contact with each otherin the second region II, an air gap G may be formed under the mergedsecond source/drains E2.

The air gap G may be formed between two second source/drains E2 being incontact with each other. The air gap G may be formed on the firstinterlayer insulating film 20. The air gap G may be covered by twosecond source/drains E2 being in contact with each other.

Then, another region of the semiconductor device according to someexemplary embodiments will be described with reference to FIGS. 5 and 6.Regions in FIGS. 5 to 6 may include a third fin-type pattern F3, afourth fin-type pattern F4, first to sixth shallow trenches ST1′-ST6′,first to third trenches T1′-T3′, a first interlayer insulating film 20,a second interlayer insulating film 30, a fifth gate electrode 200′, asixth gate electrode 300′, a seventh gate electrode 201′, an eighth gateelectrode 301′, gate insulating films 130′ and 140′, a gate spacer 160′,a third source/drain E3, a fourth source/drain E4, and so on.

The third region III and the fourth region IV may have similarstructures with the first region I and the second region II describedabove. However, a distance between the fifth gate electrode 200′ and thesixth gate electrode 300′ in the third region III, and a distancebetween the seventh gate electrode 201′ and the eighth gate electrode301′ in the fourth region IV may be a second distance D2 that is greaterthan the first distance D1 in the first region I and the second regionII.

The fifth gate electrode 200′ may include a fifth work function metal210′ and a fifth filling metal 220′. The fifth work function metal 210′plays a role of adjusting a work function, and the fifth filling metal220′ plays a role of filling the space formed by the fifth work functionmetal 210′. The fifth work function metal 210′ may be, for example, anN-type work function metal, a P-type work function metal, or acombination thereof.

The sixth gate electrode 300′ may include a sixth work function metal310′ and a sixth filling metal 320′. The sixth work function metal 310′plays a role of adjusting a work function, and the sixth filling metal320′ plays a role of filling the space formed by the sixth work functionmetal 310′. The sixth work function metal 310′ may be, for example, anN-type work function metal, a P-type work function metal, or acombination thereof.

In some exemplary embodiments, the third region III may be a PMOSregion, and therefore the fifth work function metal 210′ and the sixthwork function metal 310′ may be a combination of an N-type work functionmetal and a P-type work function metal. For example, the fifth workfunction metal 210′ and the sixth work function metal 310′ may includeat least one of TiN, WN, TiAl, TiAlN, TaN, TiC, TaC, TaCN, TaSiN, or acombination thereof, but not limited thereto. The fifth filling metal220′ and the sixth filling metal 320′ may include, for example, at leastone of W, Al, Cu, Co, Ti, Ta, poly-Si, SiGe, or a metal alloy, but notlimited thereto.

The seventh gate electrode 201′ may include a seventh work functionmetal 211′ and a seventh filling metal 221′. The seventh work functionmetal 211′ plays a role of adjusting a work function, and the seventhfilling metal 221′ plays a role of filling the space formed by theseventh work function metal 211′. The seventh work function metal 211′may be, for example, an N-type work function metal, a P-type workfunction metal, or a combination thereof.

The eighth gate electrode 301′ may include an eighth work function metal311′ and an eighth filling metal 321′. The eighth work function metal311′ plays a role of adjusting a work function, and the eighth fillingmetal 321′ plays a role of filling the space formed by the eighth workfunction metal 311′. The eighth work function metal 311′ may be, forexample, an N-type work function metal, a P-type work function metal, ora combination thereof.

In some exemplary embodiments, the fourth region IV may be an NMOSregion, and therefore the seventh work function metal 211′ and theeighth work function metal 311′ may be an N-type work function metal.The seventh work function metal 211′ and the eighth work function metalmay include, for example, at least one of TiN, WN, TiAl, TiAlN, TaN,TiC, TaC, TaCN, TaSiN, or a combination thereof, but not limitedthereto. The seventh filling metal 221′ and the eighth filling metal321′ may include at least one of, for example, W, Al, Cu, Co, Ti, Ta,poly-Si, SiGe, or a metal alloy, but not limited thereto.

For example, the fifth gate electrode 200′, the sixth gate electrode300′, the seventh gate electrode 301′, and the eighth gate electrode301′ may be formed by a replacement process or a gate last process, butnot limited thereto.

Third source/drains E3 may be formed on both sides of the fifth gateelectrode 200′ and the sixth gate electrode 300′ in the first directionX, and on the respective third fin-type patterns F3. The thirdsource/drains E3 may be source/drain regions of respective transistorson the third fin-type patterns F3.

Fourth source/drains E4 may be formed on both sides of the seventh gateelectrode 201′ and the eighth gate electrode 301′ in the first directionX, and on the respective fourth fin-type patterns F4. The fourthsource/drains E4 may be source/drain regions of respective transistorson the fourth fin-type patterns F4.

The third source/drains E3 and the fourth source/drains E4 may includean epitaxial layer formed by epitaxy. For example, the thirdsource/drains E3 and the fourth source/drains E4 may be raisedsource/drains. The third region III may be a PMOS region and the fourthregion IV may be an NMOS region, and therefore the third source/drainsE3 may be SiGe epitaxial layers, for example. The fourth source/drainsE4 may be Si epitaxial layers, for example. At this time, the fourthsource/drains E4 may include Si:P highly doped with phosphorus P.

The third source/drains E3 may fill a recess F3 r of the third fin-typepatterns F3. Likewise, the fourth source/drains E4 may fill a recess F4r of the fourth fin-type patterns F4.

FIG. 6 is a cross sectional view in a first direction X. Referring toFIG. 6, the third source/drains E3 in the third region III may be formedso as to fill the recess F3 r formed on an upper surface of the thirdfin-type patterns F3. At this time, since the fifth gate electrode 200′and the sixth gate electrode 300′ are formed in a portion in which norecess F3 r is formed on the upper surface of the third fin-typepatterns F3, the third source/drains E3 may be formed between the fifthgate electrode 200′ and the sixth gate electrode 300′.

The third source/drains E3 may have a same level of upper surface as thethird fin-type patterns F3. For example, a height of an upper surface ofthe third source/drains E3 may be equal to a height of the upper surfaceof the third fin-type patterns F3. The upper surface of the thirdsource/drains E3 may be flat. For example, a height of a highest pointof the upper surface from a lowermost level of the upper surface may beless than 5 nm. A portion of the upper surface of the thirdsource/drains E3 may be overlapped with a portion of the lower surfaceof the gate spacer 160′. For example, a portion of the upper surface ofthe third source/drains E3 may be in contact with a portion of a lowersurface of the gate spacer 160′.

The fourth source/drains E4 in the fourth region IV may be formed so asto fill the recess F4 r formed on an upper surface of the fourthfin-type patterns F4. At this time, since the seventh gate electrode201′ and the eighth gate electrode 301′ are formed in the portion inwhich no recess F4 r is formed on the upper surface of the fourthfin-type patterns F4, the fourth source/drains E4 may be formed betweenthe seventh gate electrode 201′ and the eighth gate electrode 301′.

The fourth source/drains E4 may have a same level of upper surface asthe fourth fin-type patterns F4. For example, a height of an uppersurface of the fourth source/drains E4 may be equal to a height of theupper surface of the fourth fin-type patterns F4. The upper surface ofthe fourth source/drains E4 may be flat. For example, a height of ahighest point of the upper surface from a lowermost level of the uppersurface may be less than 5 nm. A portion of the upper surface of thefourth source/drains E4 may be overlapped with a portion of the lowersurface of the gate spacer 160′. For example, a portion of the uppersurface of the fourth source/drains E4 may be in contact with a portionof a lower surface of the gate spacer 160′.

The upper surface of the fourth source/drains E4 may be formed apartfrom the bottom surface of the recess F4 r formed in the fourth fin-typepatterns F4 by a second height h2. The second height h2 may be greaterthan a height h2′ by which the upper surface of the third source/drainE3 is spaced apart from the bottom surface of the recess F3 r. However,exemplary embodiments are not limited to the example given above. Thesecond height h2 may be between 35 nm and 55 nm. The second height h2may be between 40 nm and 50 nm. The height h2′ may be between 25 nm and45 nm. The height h2′ may be between 30 nm and 40 nm. For example, theratio of h2 to h2′ may be between 1.1:1 and 2:1. For example, the ratioof h2 to h2′ may be between 1.2:1 and 1.5:1.

Next, another region of the semiconductor device according to someexemplary embodiments will be described with reference to FIGS. 7 and 8.Regions in FIGS. 7 to 8 may include a fifth fin-type pattern F5, a sixthfin-type pattern F6, first to sixth shallow trenches ST1″-ST6″, first tothird trenches T1″-T3″, a first interlayer insulating film 20, a secondinterlayer insulating film 30, a ninth gate electrode 200″, a tenth gateelectrode 300″, an eleventh gate electrode 201″, a twelfth gateelectrode 301″, gate insulating films 130″ and 140″, a gate spacer 160″,a fifth source/drain E5, a sixth source/drain E6, and so on.

The fifth region V and the sixth region VI may have similar structureswith the third region III and the fourth region IV described above.However, a distance between the ninth gate electrode 200″ and the tenthgate electrode 300″ in the fifth region V, and a distance between theeleventh gate electrode 201″ and the twelfth gate electrode 301″ in thesixth region VI may be a third distance D3 that is greater than thesecond distance D2 in the third region III and the fourth region IV.

The ninth gate electrode 200″ may include a ninth work function metal210″ and a ninth filling metal 220″. The ninth work function metal 210″plays a role of adjusting a work function, and the ninth filling metal220″ plays a role of filling the space formed by the ninth work functionmetal 210″. The ninth work function metal 210″ may be, for example, anN-type work function metal, a P-type work function metal, or acombination thereof.

The tenth gate electrode 300″ may include a tenth work function metal310″ and a tenth filling metal 320″. The tenth work function metal 310″plays a role of adjusting a work function, and the tenth filling metal320″ plays a role of filling the space formed by the tenth work functionmetal 310″. The tenth work function metal 310″ may be, for example, anN-type work function metal, a P-type work function metal, or acombination thereof.

In some exemplary embodiments, the fifth region V may be a PMOS region,and therefore the ninth work function metal 210″ and the tenth workfunction metal 310″ may be a combination of an N-type work functionmetal and a P-type work function metal. For example, the ninth workfunction metal 210″ and the tenth work function metal 310″ may includeat least one of TiN, WN, TiAl, TiAlN, TaN, TiC, TaC, TaCN, TaSiN, or acombination thereof, but not limited thereto. The ninth filling metal220″ and the tenth filling metal 320″ may include, for example, at leastone of W, Al, Cu, Co, Ti, Ta, poly-Si, SiGe, or a metal alloy, but notlimited thereto.

The eleventh gate electrode 201″ may include an eleventh work functionmetal 211″ and an eleventh filling metal 221″. The eleventh workfunction metal 211″ plays a role of adjusting a work function, and theeleventh filling metal 221″ plays a role of filling the space formed bythe eleventh work function metal 211″. The eleventh work function metal211″ may be, for example, an N-type work function metal, a P-type workfunction metal, or a combination thereof.

The twelfth gate electrode 301″ may include a twelfth work functionmetal 311″ and a twelfth filling metal 321″. The twelfth work functionmetal 311″ plays a role of adjusting a work function, and the twelfthfilling metal 321″ plays a role of filling the space formed by thetwelfth work function metal 311″. The twelfth work function metal 311″may be, for example, an N-type work function metal, a P-type workfunction metal, or a combination thereof.

In some exemplary embodiments, the sixth region VI may be an NMOSregion, and therefore the eleventh work function metal 211″ and thetwelfth work function metal 311″ may be an N-type work function metal.The eleventh work function metal 211″ and the twelfth work functionmetal may include at least one of, for example, TiN, WN, TiAl, TiAlN,TaN, TiC, TaC, TaCN, TaSiN, or a combination thereof, but not limitedthereto. The eleventh filling metal 221″ and the twelfth filling metal321″ may include at least one of, for example, W, Al, Cu, Co, Ti, Ta,poly-Si, SiGe, or a metal alloy, but not limited thereto.

For example, the ninth gate electrode 200″, the tenth gate electrode300″, the eleventh gate electrode 201″, and the twelfth gate electrode301″ may be formed by a replacement process or a gate last process, butnot limited thereto.

Fifth source/drains E5 may be formed on both sides of the ninth gateelectrode 200″ and the tenth gate electrode 300″ in the first directionX, and on the respective fifth fin-type patterns F5. The fifthsource/drains E5 may be source/drain regions of respective transistorson the fifth fin-type patterns F5.

Sixth source/drains E6 may be formed on both sides of the eleventh gateelectrode 201″ and of the twelfth gate electrode 301″ in the firstdirection X, and on the sixth fin-type patterns F6, respectively. Thesixth source/drains E6 may be source/drain regions of respectivetransistors on the sixth fin-type pattern F6.

The fifth source/drains E5 and the sixth source/drains E6 may include anepitaxial layer formed by epitaxy. For example, the fifth source/drainsE5 and the sixth source/drains E6 may be raised source/drains. The fifthregion V may be a PMOS region and the sixth region VI may be an NMOSregion, and therefore the fifth source/drains E5 may be a SiGe epitaxiallayer, for example. The sixth source/drains E6 may be a Si epitaxiallayer, for example. At this time, the sixth source/drains E6 may includeSi:P highly doped with phosphorus P.

The fifth source/drains E5 may fill a recess F5 r of the fifth fin-typepatterns F5. Likewise, the sixth source/drains E6 may fill a recess F6 rof the sixth fin-type patterns F6.

FIG. 8 is a cross sectional view in a first direction X. Referring toFIG. 8, the fifth source/drains E5 in the fifth region V may be formedso as to fill the recess F5 r formed on an upper surface of the fifthfin-type patterns F5. At this time, since the ninth gate electrode 200″and the tenth gate electrode 300″ are formed in the portion in which norecess F5 r is formed on the upper surface of the fifth fin-typepatterns F5, the fifth source/drains E5 may be formed between the ninthgate electrode 200″ and the tenth gate electrode 300″.

The fifth source/drains E5 may have the same level of upper surface asthe fifth fin-type patterns F5. For example, a height of an uppersurface of the fifth source/drains E5 may be equal to a height of theupper surface of the fifth fin-type patterns F5. The upper surface ofthe fifth source/drains E5 may be flat. For example, a height of ahighest point of the upper surface from a lowermost level of the uppersurface may be less than 5 nm. A portion of the upper surface of thefifth source/drains E5 may be overlapped with a portion of the lowersurface of the gate spacer 160″. For example, a portion of the uppersurface of the fifth source/drains E5 may be in contact with a portionof a lower surface of the gate spacer 160″.

The sixth source/drains E6 in the sixth region VI may be formed so as tofill the recess formed on an upper surface of the sixth fin-typepatterns F6. At this time, since the eleventh gate electrode 201″ andthe twelfth gate electrode 301″ are formed in the portion in which norecess F6 r is formed on the upper surface of the sixth fin-typepatterns F6, the sixth source/drains E6 may be formed between theeleventh gate electrode 201″ and the twelfth gate electrode 301″.

The sixth source/drains E6 may have a higher upper surface than thesixth fin-type patterns F6. For example, a height of an upper surface ofthe sixth fin-type patterns F6 may be less than that of an upper surfaceof the sixth source/drains E6. The upper surface of the sixthsource/drains E6 may include a concave portion CC. A portion of theupper surface of the sixth source/drains E6 may be overlapped with aportion of the lower surface of the gate spacer 160″. For example, aportion of the upper surface of the fifth source/drains E6 may be incontact with a portion of a lower surface of the gate spacer 160″.

The concave portion CC of the upper surface of the sixth source/drainsE6 may be formed lower than a point where the sixth source/drains E6 andthe gate spacers 160″ meet. A first convex portion CV1 and a secondconvex portion CV2 may be formed on both sides of the concave portionCC. The first convex portion CV1 may be a point where one of the gatespacers 160″ and one of the sixth source/drains E6 meet. However,exemplary embodiments are not limited to the example given above. Thesecond convex portion CV2 may be spaced apart from a point where one ofthe gate spacers 160″ and one of the sixth source/drains E6 meet, by apredetermined distance. However, exemplary embodiments are not limitedto the example given above. For example, a position of the convexportion may or may not be a position contacting with the gate spacer160″.

The concave portion CC may be formed as high as a third height h3 fromthe bottom surface of the recess F6 r formed in the sixth fin-typepatterns F6. The third height may be greater than a height at which theupper surface of the fifth source/drains E5 is spaced apart from thebottom surface of the recess F5 r. However, exemplary embodiments arenot limited to the example given above. For example, the third height h3may be between 20 nm and 40 nm. For example, the third height h3 may bebetween 25 nm and 35 nm.

A lowermost portion of an upper surface of the sixth source/drains E6may be positioned higher than the sixth fin-type patterns F6. Forexample, the lowermost portion of the upper surface of the sixthsource/drain E6 is a lowermost portion of the upper surface of theconcave portion CC. The lowermost portion of the upper surface of theconcave portion CC may be formed higher than the upper surface of thesixth fin-type pattern by a fourth height h4. For example, the fourthheight h4 may be the difference between the height of the upper surfaceof the sixth fin-type pattern F6 and the height of the lowermost portionof the concave portion of the upper surface of the sixth source/drainE6. For example, the fourth height h4 may be less than 20 nm. Forexample, the fourth height h4 may be less than 10 nm. For example, h4 isless than 50% of h3. For example, h4 is less than 30% of h3.

Then, the first region I, the third region III, and the fifth region Vwill be compared with reference to FIG. 9, and the second region II, thefourth region IV, and the sixth region VI will be compared withreference to FIG. 10.

First, referring to FIG. 9, a first region I, a third region III, and afifth region V of a semiconductor device according to some exemplaryembodiments will be compared below.

In the first region I, the third region III, and the fifth region V,distances between gate electrodes may gradually increase. For example, adistance between the first gate electrode 200 and the second gateelectrode 300 in the first region I may be a first distance D1, adistance between the fifth gate electrode 200′ and the sixth gateelectrode 300′ in the third region III may be a second distance D2, anda distance between the ninth gate electrode 200″ and the tenth gateelectrode 300″ in the fifth region V may be a third distance D3. Thefirst distance D1 may be less than the second distance D2, and thesecond distance D2 may be less than the third distance D3.

As the distances between the gate electrodes in the first region I, thethird region III, and the fifth region V are gradually increasing, awidth of the third source/drains E3 may be greater than that of thefirst source/drains E1, and a width of the fifth source/drains E5 may begreater than that of the third source/drains E3. For example, the widthof the upper surface of the third source/drain E3 in a cross-sectionalview as shown in FIG. 6 may be between 30 nm and 60 nm. For example thewidth of the upper surface of the third source/drain E3 in thecross-sectional view may be between 40 nm and 50 nm. For example, thewidth of the upper surface of the fifth source/drain E5 in across-sectional view as shown in FIG. 8 may be between 50 nm and 120 nm.For example the width of the upper surface of the fifth source/drain E5in the cross-sectional view may be between 65 nm and 85 nm.

On the contrary, heights of the upper surfaces of the firstsource/drains E1, the third source/drains E3, and the fifthsource/drains E5 may be all equal. Each of the first region I, the thirdregion III, and the fifth region V may be a PMOS region. Accordingly,the recesses F1 r, F3 r, and F5 r may be completely filled over timebecause the first source/drains E1, the third source/drains E3, and thefifth source/drains E5 may include SiGe and grow completely saturated in(111) plane. Accordingly, the first source/drains E1, the thirdsource/drains E3, and the fifth source/drains E5 may be all filled tothe same heights.

Then, referring to FIG. 10, a second region II, a fourth region IV, anda sixth region VI of a semiconductor device according to some exemplaryembodiments will be compared below.

In the second region II, the fourth region IV, and the sixth region VI,distances between gate electrodes may gradually increase. For example, adistance between the third gate electrode 201 and the fourth gateelectrode 301 in the second region II may be a first distance D1, adistance between the seventh gate electrode 201′ and the eighth gateelectrode 301′ in the fourth region IV may be a second distance D2, anda distance between the eleventh gate electrode 201″ and the twelfth gateelectrode 301″ in the sixth region VI may be a third distance D3. Thefirst distance D1 may be less than the second distance D2, and thesecond distance D2 may be less than the third distance D3.

As the distances between the gate electrodes in the second region II,the fourth region IV, and the sixth region VI are gradually increased, awidth of the fourth source/drain E4 may be greater than that of thesecond source/drains E2, and a width of the sixth source/drains E6 maybecome greater than that of the fourth source/drains E4. For example,the width of the upper surface of the fourth source/drain E4 in across-sectional view as shown in FIG. 6 may be between 30 nm and 60 nm.For example the width of the upper surface of the fourth source/drain E4in the cross-sectional view may be between 40 nm and 50 nm. For example,the width of the upper surface of the sixth source/drain E6 in across-sectional view as shown in FIG. 8 may be between 50 nm and 120 nm.For example the width of the upper surface of the sixth source/drain E6in the cross-sectional view may be between 65 nm and 85 nm.

The upper surface of the second source/drains E2 may include a convexportion CV. The upper surface of the fourth source/drains E4 may beflat. For example, a height of a highest point of the upper surface froma lowermost level of the upper surface may be less than 5 nm. The uppersurface of the sixth source/drains E6 may include a concave portion CC.For example, as the distances between the gate electrodes are increased,a shape of the upper surface of the source/drains may be changed fromupward facing convex to downward facing convex.

This may be occurred because an epitaxial growth rate of Si:P doped withphosphorus P in high concentration is varied according to a distance(i.e., an open space) between the gate electrodes. The epitaxial growthmay have a different rate according to a direction of a growth plane.For example, (100) plane direction may have the highest growth rate, and(110) plane direction may have the second highest growth rate. Thegrowth rate may be the slowest in (111) plane direction in which the(100) plane and (110) plane meet.

When the bottom surfaces of the recesses F2 r, F4 r and F6 r are formedflat, the upper surface of the source/drains may be formed flataccording to the growth rate in (100) plane of the bottom surface, thegrowth rate in (110) plane of the side surface, and the growth rate in(111) plane as an overlapping portion in which (110) plane of the sidesurface of (100) plane of the bottom surface meets. For example, each ofthe flat bottom surfaces of the recesses F2 r, F4 r and F6 r may have aroughness that a height of a highest point of the bottom surface from alowermost level of the bottom surface may be less than 5 nm.

In certain embodiments, the bottom surfaces of the recesses F2 r, F4 rand F6 r may not be flat, and there are not many pure (100) planes. Incertain embodiments, at least two of (100) plane, (110) plane, and (111)plane are overlapped with each other, a distribution of the growth ratemay be varied according to planes of the recesses F2 r, F4 r and F6 r.Accordingly, a shape of the source/drains may vary in an NMOS region.For example, the growth rate in the bottom surface may be decreased.Accordingly, the growth rate of the side surface may be relativelyincreased.

In certain embodiments, although the epitaxial growth starts at surfacesof bottom surface and side surface, atoms of Si are diffused along asidewall of an insulating film. For example, an epitaxial growth of Simay be greater on the sidewall of the recesses F2 r, F4 r and F6 rconnected with the sidewall of the insulating film than an epitaxialgrowth of Si on the bottom surface of the recesses F2 r, F4 r and F6 r.

For example, when distances of the gate electrodes are graduallyincreased from the first distance D1 to the second distance D2, and thento the third distance D3, it may cause a change of shapes of thesource/drains in the NMOS region.

For example, when a distance of the gate electrodes is short, the uppersurface of the second source/drains E2 may include a convex portion CVlike the second region II. For example, when a distance of the gateelectrodes becomes a bit greater, the upper surface of the fourthsource/drains E4 may become flat like the fourth region IV. For example,a height of a highest point of an upper surface of a fourth source/drainE4 from a lowermost level of the upper surface of the fourthsource/drain may be less than 5 nm. Also at this time, according toreasons described above, a plurality of fourth source/drains E4 may be anon-finite form, and may have an irregular shape. For example, thefourth source/drains E4 may not be flat, and have an upper surfaceincluding fine curves. For example, the upper surface of the fourthsource/drains E4 may have an uneven surface.

When a distance between the gate electrodes increase, the upper surfaceof the sixth source/drains E6 may include a concave portion CC like thesixth region VI. For example, because the epitaxial growth of thesource/drains E6 happens more in sidewall of the recess F6 r, aresultant shape may be concaved in the center. For example, an epitaxialgrowth of the source/drains E6 may be faster than an epitaxial growth insidewalls of the recess F6 r, and the upper surface of the source/drainsE6 may have a concave shape. This may be a shape resulted according to amethod for fabricating a semiconductor device having operatingcharacteristics of high efficiency in the NMOS region including highconcentration of phosphorus P. While the concave portion CC may beformed in the center of the sixth source/drains E6, the first convexportion CV1 and the second convex portion CV2, which are relativelyconvex, may be formed in both sides of the concave portion CC.

For example, the center of the upper surface of a source/drain may belower than side portions of the upper surface of the source/drain. Theside portions of the upper surface may be portions that an upper surfaceof the source/drain contacts gate spacers. The side portions of theupper surface may be portions in the midway between the center of theupper surface of the source/drain and the point that the upper surfacecontacts gate spacers. In certain embodiments, the side portions of theupper surface may be the points that the upper surface of thesource/drain contacts the gate surfaces. The upper surface of thesource/drain may be a boundary surface that the source/drain contact asecond interlayer insulating film 30 described above.

For example, a depth of the concave portion CC may be a verticaldistance between the lowest point of the upper surface of the concaveportion CC of the sixth source/drain E6 and the highest point of theconvex portions CV1 and CV2 of the sixth source/drain E6. The depth ofthe concave portion CC may be less than 50 nm. For example, the depth ofthe concave portion CC may be less than 30 nm. For example, a height ofthe sixth source/drain may be a vertical distance between the lowermostpoint of the lower surface of the sixth source/drain E6 and the highestpoint of the convex portions CV1 and CV2. The height of the sixthsource/drain E6 may be between 35 nm and 100 nm. For example, the heightof the sixth source/drain E6 may be between 40 nm and 70 nm. For examplethe depth of the concave portion CC of the sixth source/drain E6 may bebetween 10% and 60% of the height of the sixth source/drain E6. Forexample, the depth of the concave portion CC of the sixth source/drainE6 may be between 10% and 45% of the height of the sixth source/drainE6. For example, the depth of the concave portion CC of the sixthsource/drain E6 may be between 15% and 30% of the height of the sixthsource/drain E6.

The heights may be all equal. For example, each of the first region I,the third region III, and the fifth region V may be a PMOS region. Forexample, the recesses F1 r, F3 r, and F5 r may be completely filled overtime because the first source/drains E1, the third source/drains E3, andthe fifth source/drains E5 include SiGe and grow completely saturated in(111) plane. For example, the first source/drains E1, the thirdsource/drains E3, and the fifth source/drains E5 may be all filled tothe same heights.

Hereinbelow, a semiconductor device according to some exemplaryembodiments will be described with reference to FIGS. 1 and 11. Elementsor operations overlapping with some exemplary embodiments describedabove will be mentioned as briefly as possible or omitted for the sakeof brevity.

FIG. 11 is cross sectional views provided to explain a semiconductordevice according to some exemplary embodiments. FIG. 11 is crosssectional views taken on lines A-A′ and B-B′ of FIG. 1.

Referring to FIGS. 1 and 11, lower portions of a recess F1 r and asource/drain E1 of the semiconductor device according to some exemplaryembodiments may be in a U-shape in the first region I. For example, thelower portion of the first source/drain E1 may not be formed flat, butformed in a shape in which curves are overlapped in a cross-sectionalview. The lower portion of the first source/drain E1 may have a shapethat curved surfaces are overlapped. For example, in the case of PMOS asdescribed above, even when the lower portion of the recess F1 r is notflat such that the growth rate of the epitaxial growth is variedaccording to the planes, over time, the first source/drain E1 may beformed in the form that completely fills the recess F1 r.

For example, each of the lower portions of the recess F1 r and thesource/drain E1 may be a lower portion of a boundary surface that thesource/drain contacts the substrate 10 described above. Theseexpressions may be applied similarly to lower portions of the otherrecesses and source/drains in the current disclosure. The top surface ofa source/drain in a PMOS region may be flat when the bottom surface ofthe source/drain is either flat or uneven. For example, a height of ahighest point of the top surface from a lowermost level of the topsurface may be less than 5 nm. The top surface of a source/drain may bea boundary surface that the source/drain contacts a second interlayerinsulating film 30 described above. The bottom surface of thesource/drain may be a boundary surface that the source/drain contactsthe substrate 10 described above.

The lower portions of the recess F2 r and a second source/drain E2 maybe in a U-shape in the second region II. For example, the lower portionof the second source/drain E2 may not be formed flat, but formed in ashape in which curves are overlapped in a cross-sectional view. Asdescribed above, because phosphorus P is doped with high concentrationin the NMOS unlike the PMOS and the growth rate of the planes overlappedeach other are different, a shape of the epitaxial growth layer may beirregular. For example, the upper surface of the second source/drain E2may be irregular.

Although not illustrated, the recesses F3 r-F6 r in the third to sixthregions III-VI may also have the U-shaped lower portion like recesses F1r and F2 r in FIG. 11.

Hereinbelow, a semiconductor device according to some exemplaryembodiments will be described with reference to FIGS. 7 and 12. Elementsor operations overlapping with some exemplary embodiments describedabove will be mentioned as briefly as possible or omitted for the sakeof brevity.

FIG. 12 is cross sectional views provided to explain a semiconductordevice according to some exemplary embodiments. FIG. 12 is crosssectional views taken on lines A-A′ and B-B′ of FIG. 7.

Referring to FIGS. 7 and 12, a lowermost portion of the concave portionCC of the upper surface of a sixth source/drain E6 of the semiconductordevice according to some exemplary embodiments may be positioned lowerthan the upper surface of the sixth fin-type pattern F6. For example,the upper surface of the sixth fin-type pattern F6 may be located higherthan the lowermost portion of the concave portion CC by a fourth heighth4. For example, the fourth height h4 may be the difference between theheight of the upper surface of sixth fin-type pattern F6 and the heightof the lowermost portion of the concave portion of the upper surface ofthe sixth source/drain E6. For example, the fourth height h4 may be lessthan 20 nm. For example, the fourth height h4 may be less than 10 nm.For example, h4 is less than 50% of h3. For example, h4 is less than 30%of h3. For example, the upper surface of the sixth fin-type pattern F6may be a boundary surface that the sixth fin-type pattern F6 contactsthe gate insulating film 130. This expression may also be applied toother upper surfaces of fin-type patterns described in the currentdisclosure.

As a distance between the eleventh gate electrode 201″ and the twelfthgate electrode 301″ increases by the third distance D3, the concaveportion CC of the upper surface of the sixth portion/drain E6 may belowered further than the upper surface of the sixth fin-type pattern F6.For example, the distance between the eleventh gate electrode 201″ andthe twelfth gate electrode 301″ may be a third distance D3, and theconcave portion CC of the upper surface of the sixth portion/drain E6may be lower than the upper surface of the sixth fin-type pattern F6.

Hereinbelow, a semiconductor device according to some exemplaryembodiments will be described with reference to FIGS. 1 and 13. Elementsor operations overlapping with some exemplary embodiments describedabove will be mentioned as briefly as possible or omitted for the sakeof brevity.

FIG. 13 is cross sectional views provided to explain a semiconductordevice according to some exemplary embodiments.

Referring to FIG. 13, the semiconductor device according to someexemplary embodiments may include a capping film 150, and a firstsilicide S1 and a second silicide S2 on a first source/drain E1 and asecond source/drain E2, respectively.

The capping film 150 may be formed on the high-k dielectric film 140 andthe first gate electrode 200. For example, the capping film 150 mayinclude SiN. The capping film 150 may be in contact with an inner wallof the gate spacer 160. The upper surface of the capping film 150 may beon a same level as the upper surface of the gate spacer 160, but notlimited thereto. The upper surface of the capping film 150 may be higherthan the upper surface of the gate spacer 160.

The first and second silicides S1 and S2 may be formed on the firstsource/drain E1 and the second source/drain E2. The silicides S1 and S2may be formed as a portion of each of the first source/drain E1 and thesecond source/drain E2. For example, the silicides S1 and S2 may beformed by a modification of the first and second source/drains E1 andE2. The silicides S1 and S2 may include a metal. The metal may include,for example, at least one of Ni, Co, Pt, Ti, W, Hf, Yb, Tb, Dy, Er, Pd,and a metal alloy thereof.

Contact holes ch1 and ch2 may pass through the second interlayerinsulating film 30 and the third interlayer insulating film 40 to exposeat least a portion of the first and second silicides S1 and S2. Barrierlayers L1 and L2 may be formed conformally along a side surface and abottom surface of the contact holes ch1 and ch2, and contacts C1 and C2may be formed on the barrier layers L1 and L2 to fill the contact holesch1 and ch2.

In this case, the first source/drain E1 and the second source/drain E2may include a protrusion protruded from the substrate 10. For example,the protrusion may protrude from the surface of the first fin-typepatterns F1 and the second fin-type patterns F2 to surround both sidesof the first and second silicides S1 and S2. For example, the silicidesS1 and S2 may be surrounded by the first and second source/drains E1 andE2 respectively in a plane view. For example, the outer most surface ofthe first and second silicides S1 and S2 are in contact with the firstand second source/drains E1 and E2 in a plane view.

As illustrated in FIG. 13, the protrusion may be in such a shape havingdecreasing width with an increasing distance from the surface of thesubstrate 10.

For example, the protrusion may be in such a shape surrounding at least½ of the vertical length of the first and second silicides S1 and S2 ina cross-sectional view. In the drawings, the protrusion is illustratedas a shape surrounding the entire side surface of the first and secondsilicides S1 and S2, but not limited thereto.

For example, in at least a portion of the surface of the firstsource/drain E1 and the second source/drain E2, the first and secondsilicides S1 and S2 may not be formed. For example, as illustrated inFIG. 13, in regions between the first and second silicides S1 and S2 andthe first to fourth gate electrodes 200, 300, 201 and 301, there may benon-silicided surfaces of the first source/drain E1 and the secondsource/drain E2 in a plane view or a cross-sectional view.

As illustrated in FIG. 13, each of the first and second silicides S1 andS2 may be a reversed cone type. For example, a narrow tip region may bepositioned downward (towards to the substrate 10), and the bottomsurface may be positioned becoming wider upward (opposite direction tothe substrate 10). The tip region may be a lowermost point or region ofeach of the silicides S1 and S2 in a cross-sectional view. For example,since each of the first and second silicides S1 and S2 may have astructure in which the lower portion is narrow and becomes wider as itgoes upward, the side surface may be inclined to a predetermined angleθ. The predetermined angle may be for example, 30° to 70°, but notlimited thereto. More specifically, the predetermined angle may be 40°or more and 60°, but not limited thereto. The angles of the sidesurfaces may be an average angel with respect to a horizontal plane. Thehorizontal plane may be parallel with an extending surface of thesubstrate 10.

For example, tip regions of the first and second silicides S1 and S2 maybe located higher than a surface of the substrate 10. By doing this, itis helpful to achieve enough channel length of a transistor, and improveoperating characteristic of the transistor.

The first silicide S1 may be formed on the first source/drain E1. Forexample, the upper surface of the first silicide S1 may be flat. Forexample, a height of a highest point of the upper surface of the firstsilicide S1 from a lowermost level of the upper surface of the firstsilicide S1 may be less than 5 nm. However, a recess may be formed in aportion of the first silicide S1. The first contact C1 and the firstbarrier layer L1 may be formed in the recessed portion of the firstsilicide S1. For example, the upper surface of the first silicide S1 maybe flat by the first source/drain E1 except a portion in which the firstcontact C1 and the first barrier layer L1 are formed.

For example, the upper surface of the first silicide S1 may be flatexcept the portion which the first contact C and the first barrier layerL1 are formed on. In certain embodiments, the first silicide S1 may beformed on a flat surface of the first source/drain E1. For example, thetop surface of the first source/drain E1 may be flat. In certainembodiments, the first silicide S1 may be embedded in the firstsource/drain E1 that has a flat top surface, and may share a top surfacewith the first source/drain E1. For example, the top surfaces of thefirst silicide S1 and the first source/drain E1 are in the same level.

A first contact hole ch1 may be formed in a part of the upper portion ofthe first silicide S1. For example, the recess may be formed in the partof the upper portion of the first silicide S1. The recess may be in arectangle shape as illustrated in FIG. 13. However, exemplaryembodiments are not limited to the example given above.

The second silicide S2 may be formed on the second source/drain E2. Forexample, the upper surface of the second silicide S2 may be convexupward. However, a recess may be formed in a portion of the secondsilicide S2. The second contact C2 and the second barrier layer L2 areformed in the second silicide S2. For example, the upper surface of thesecond silicide S2 may be convex upward by the second source/drain E2except a portion in which the second contact C2 and the second barrierlayer L2 are formed.

For example, the upper surface of the second silicide S2 may protrudeupward except the portion which the second contact C and the secondbarrier layer L1 are formed on. For example, a center portion of the topsurface of the second silicide S2 is higher than an edge portion of thetop surface of the second silicide S2 in a cross-sectional view. Incertain embodiments, the second silicide S2 may be formed on aprotruding surface of the second source/drain E2. For example, the topsurface of the second source/drain E2 may protrude upward. For example,a center portion of the top surface of the second source/drain E2 may behigher than an edge portion of the top surface of the secondsource/drain E2. In certain embodiments, the second silicide S2 may beembedded in the second source/drain E2 which has a protruding topsurface.

A second contact hole ch2 may be formed in a part of the upper portionof the second silicide S2. For example, the recess may be formed in thepart of the upper portion of the second silicide S2. The recess may bein a rectangle shape as illustrated in FIG. 13. However, exemplaryembodiments are not limited to the example given above.

Hereinbelow, a semiconductor device according to some exemplaryembodiments will be described with reference to FIGS. 1, 13 and 14.Elements or operations overlapping with some exemplary embodimentsdescribed above will be mentioned as briefly as possible or omitted forthe sake of brevity.

FIG. 14 is an enlarged cross sectional view provided to explain asemiconductor device according to some exemplary embodiments. FIG. 14 isan enlarged cross sectional view showing an example embodiment having adifferent structure from the embodiment of FIG. 13 in the rectangularlyindicated section J of FIG. 13.

Referring to FIG. 14, a first silicide S1-1 may be formed on the firstsource/drain E1. The first silicide S1-1 may be formed as an upperportion of the first source/drain E1 is changed. For example, the firstsilicide S1-1 may be embedded in an upper portion of the firstsource/drain E1 having a flat top surface. A lower portion of the firstsilicide S1-1 may be in a U-shape. However, exemplary embodiments arenot limited to any specific example. Accordingly, various shapes may becontemplated depending on silicidation process. A first contact holech1-1 may be formed on the upper portion of the first silicide S1-1. Thefirst contact hole ch1-1 may pass through the second interlayerinsulating film 30, and be formed by etching a part of the upper portionof the first silicide S1-1.

An upper portion of the first silicide S1-1 may include a recess. Ashape of the recess may be a U-shape as illustrated in FIG. 14. However,embodiments are not limited to any of the examples given above. Variousshapes may be possible according to silicide process and a material ofthe first source/drain E1.

Hereinbelow, a semiconductor device according to some exemplaryembodiments will be described with reference to FIGS. 1, 13 and 15.Elements or operations overlapping with some exemplary embodimentsdescribed above will be mentioned as briefly as possible or omitted forthe sake of brevity.

FIG. 15 is an enlarged cross sectional view provided to explain asemiconductor device according to some exemplary embodiments. FIG. 15 isan enlarged cross sectional view showing an example embodiment having adifferent structure form the embodiment shown in FIG. 13 in therectangularly indicated section J of FIG. 13.

Referring to FIG. 15, a first silicide S1-2 may be formed on the firstsource/drain E1. The first silicide S1-2 may be formed as an upperportion of the first source/drain E1 is changed. For example, the firstsilicide S1-2 may be embedded in an upper portion of the firstsource/drain E1 having a flat top surface. For example, a flat surfacedescribed in this disclosure may have a height of a highest point of thesurface from a lowermost level of the surface may be less than 5 nm. Alower portion of the first silicide S1-2 may be in a U-shape. However,exemplary embodiments are not limited to any specific example.Accordingly, various shapes may be contemplated depending onsilicidation process. A first contact hole ch1-2 may be formed on theupper portion of the first silicide S1-2. The first contact hole ch1-2may pass through the second interlayer insulating film 30, and exposethe upper surface of the first silicide S1-2.

The upper surface of the first silicide S1-2 may not be recessed by thefirst contact hole ch1-2. For example, the upper surface of the firstsilicide S1-2 may be formed flat. Bringing the first contact hole ch1-2into a contact with the first silicide S1-2 may cause the first barrierlayer L1-2 and the first contact C1-2 to be in contact with the firstsilicide S1-2. Accordingly, the upper surface of the first silicide S1-2may maintain a flat shape.

Hereinbelow, a semiconductor device according to some exemplaryembodiments will be described with reference to FIGS. 1, 5, 7, and 16 to19. Elements or operations overlapping with some exemplary embodimentsdescribed above will be mentioned as briefly as possible or omitted forthe sake of brevity.

FIG. 16 is a cross sectional view provided to explain a semiconductordevice according to some exemplary embodiments, and FIG. 17 is anenlarged view provided to explain a shape of the silicide in the secondregion of FIG. 16. FIG. 18 is an enlarged view provided to explain ashape of the silicide in the fourth region of FIG. 16, and FIG. 19 is anenlarged view provided to explain a shape of the silicide in the sixthregion of FIG. 16. FIG. 16 is a cross sectional view take on B-B′ ofFIGS. 1, 5 and 7, and FIGS. 17 to 19 are enlarged views of the silicideof FIG. 16, in which illustration of the contacts C2-C6 and the barrierlayers L2-L6 is omitted for convenience.

Referring to FIGS. 1, 5, 7, and 16 to 19, the semiconductor devicesaccording to some exemplary embodiments include the second silicide S2,the fourth silicide S4, the sixth silicide S6, contact holes ch2-ch6,barrier layers L2-L6, and contacts C2-C6.

First, referring to FIGS. 16 and 17, the second silicide S2 in thesecond region II may include the first recess R1, the third convexportion CV3 and the fourth convex portion CV4. Since the upper surfaceof the second source/drain E2 is formed convexly upward, the uppersurface of the second silicide S2 except the first recess R1 may be in aconvexly upward shape.

The first recess R1 may be a portion in which the second contact holech2 is formed. For example, the first recess R1 may be a location wherethe second barrier layer L2 and the second contact hole C2 are formed.

For example, the third convex portion CV3 and the fourth convex portionCV4 may be formed on both sides of the first recess R1. The third convexportion CV3 and the fourth convex portion CV4 may be formed by aformation of the first recess R1 as the upper surface of the secondsource/drain E2 is convex.

Next, referring to FIGS. 16 and 18, the fourth silicide S4 in the fourthregion IV may include the second recess R2. Since the upper surface ofthe fourth source/drain E4 is formed in flat shape, the upper surface ofthe fourth silicide S4 may be in a flat shape except the second recessR2.

The second recess R2 may be a portion in which the fourth contact holech4 is formed. For example, the second recess R2 may be a location wherethe fourth barrier layer L4 and the fourth contact hole C4 are formed.

Referring to FIGS. 16 and 19, the sixth silicide S6 in the sixth regionVI may include the third recess R3 and two stepped portions ST. Sincethe upper surface of the sixth source/drain E6 is formed convexlydownward, the upper surface of the sixth silicide S6 including the thirdrecess R3 may be in a convexly-downward shape.

The third recess R3 may be a portion in which the sixth contact hole ch6is formed. For example, the third recess R3 may be a location where thesixth barrier layer L6 and the sixth contact C6 are formed.

For example, the stepped portion ST may be formed on both sides of thethird recess R3. The stepped portion ST may be a portion in which aslope is sharply changed by the third recess R3. For example, a steppedportion may be formed because, while the upper surface of the sixthsource/drain E6 is convex downward, a slope of the third recess R3 ismore sharply convex downward. However, exemplary embodiments are notlimited to any specific example. For example, the sixth contact C6 andthe sixth barrier layer L6 may also be formed without recess.

FIG. 20 is a block diagram of a SoC system including a semiconductordevice according to exemplary embodiments.

Referring to FIG. 20, the SoC system 1000 includes an applicationprocessor 1001 and a dynamic random access memory (DRAM) 1060.

The application processor 1001 may include a central processing unit(CPU) 1010, a multimedia system 1020, a bus 1030, a memory system 1040and a peripheral circuit 1050.

The CPU 1010 may perform arithmetic operation necessary for driving ofthe SoC system 1000. In some exemplary embodiments, the CPU 1010 may beconfigured on a multi-core environment which includes a plurality ofcores.

The multimedia system 1020 may be used for performing a variety ofmultimedia functions on the SoC system 1000. The multimedia system 1020may include a 3D engine module, a video codec, a display system, acamera system, a post-processor, or the like.

The bus 1030 may be used for exchanging data communication among the CPU1010, the multimedia system 1020, the memory system 1040 and theperipheral circuit 1050. In some exemplary embodiments of the presentdisclosure, the bus 1030 may have a multi-layer structure. For example,the bus 1030 may be a multi-layer advanced high-performance bus (AHB),or a multi-layer advanced eXtensible interface (AXI), although exemplaryembodiments are not limited herein.

The memory system 1040 may provide environments necessary for theapplication processor 1001 to connect to an external memory (e.g., DRAM1060) and perform high-rate operation. In some exemplary embodiments ofthe present disclosure, the memory system 1040 may include a separatecontroller (e.g., DRAM controller) to control an external memory (e.g.,DRAM 1060).

The peripheral circuit 1050 may provide environments necessary for theSoC system 1000 to have a seamless connection to an external device(e.g., main board). For example, the peripheral circuit 1050 may includea variety of interfaces to allow compatible operation with the externaldevice connected to the SoC system 1000.

The DRAM 1060 may function as an operation memory necessary for theoperation of the application processor 1001. In some exemplaryembodiments, the DRAM 1060 may be disposed externally to the applicationprocessor 1001, as illustrated in FIG. 20. For example, the DRAM 1060may be packaged into a package on package (PoP) type with theapplication processor 1001.

At least one of the above-mentioned components of the SoC system 1000may include at least one of the semiconductor devices according to theexemplary embodiments explained above.

FIG. 21 is a block diagram of an electronic system including asemiconductor device according to exemplary embodiments.

Referring to FIG. 21, the electronic system 1100 according to anexemplary embodiment may include a controller 1110, an input/output(I/O) device 1120, a memory device 1130, an interface 1140 and a bus1150. The controller 1110, the I/O device 1120, the memory device 1130and/or the interface 1140 may be coupled with one another via the bus1150. The bus 1150 corresponds to a path through which data travels.

The controller 1110 may include at least one of microprocessor, digitalsignal processor, micro controller, and logic devices capable ofperforming functions similar to the functions of those mentioned above.The I/O device 1120 may include a keypad, a keyboard, a display device,and so on. The memory device 1130 may store data and/or instructions,and so on. The interface 1140 may perform a function of transmitting orreceiving data to or from communication networks. The interface 1140 maybe in a wired or wireless form. For example, the interface 1140 mayinclude an antenna or a wired/wireless transceiver.

Although not illustrated, the electronic system 1100 may additionallyinclude an operation memory configured to enhance operation of thecontroller 1110, such as a high-rate dynamic random access memory (DRAM)and/or a static random access memory (SRAM).

A semiconductor device according to one of the exemplary embodimentsdescribed above may be provided within the memory device 1130, orprovided as a part of the controller 1110, the I/O device 1120, and soon.

The electronic system 1100 is applicable to a personal digital assistant(PDA) portable computer, a web tablet, a wireless phone, a mobile phone,a digital music player, a memory card, or almost all electronic productscapable of transmitting and/or receiving data in wireless environment.

While the present inventive concept has been particularly shown anddescribed with reference to exemplary embodiments thereof, it will beunderstood by those of ordinary skill in the art that various changes inform and details may be made therein without departing from the spiritand scope of the present inventive concept as defined by the followingclaims. It is therefore desired that the present embodiments beconsidered in all respects as illustrative and not restrictive,reference being made to the appended claims rather than the foregoingdescription to indicate the scope of the invention.

What is claimed is:
 1. A semiconductor device, comprising: a substratecomprising first and second regions; in the first region, first andsecond gate electrodes extending parallel to each other on thesubstrate, and being spaced apart from each other by a first distance;in the second region, third and fourth gate electrodes extendingparallel to each other on the substrate, and being spaced apart fromeach other by a second distance which is greater than the firstdistance; in the first region, a first recess formed on the substratebetween the first and second gate electrodes; in the second region, asecond recess formed on the substrate between the third and fourth gateelectrodes; a first epitaxial source/drain filling the first recess; anda second epitaxial source/drain filling the second recess, wherein anuppermost portion of an upper surface of the first epitaxialsource/drain is higher than an uppermost portion of an upper surface ofthe second epitaxial source/drain.
 2. The semiconductor device of claim1, wherein the upper surface of the first epitaxial source/draincomprises a convex portion.
 3. The semiconductor device of claim 2,wherein an uppermost portion of the convex portion is higher than anupper surface of the substrate.
 4. The semiconductor device of claim 1,wherein the upper surface of the second epitaxial source/drain comprisesa concave portion.
 5. The semiconductor device of claim 4, wherein alowermost portion of an upper surface of the concave portion is higherthan an upper surface of the substrate.
 6. The semiconductor device ofclaim 4, wherein a lowermost portion of an upper surface of the concaveportion is lower than an upper surface of the substrate.
 7. Thesemiconductor device of claim 1, wherein the first and second regionsare NMOS regions.
 8. The semiconductor device of claim 1, wherein thesubstrate further comprises third and fourth regions, and wherein thesemiconductor device further comprises: in the third region, fifth andsixth gate electrodes extending parallel to each other on the substrate,and being spaced apart from each other by the first distance; in thefourth region, seventh and eighth gate electrodes extending parallel toeach other on the substrate, and being spaced apart from each other bythe second distance; in the third region, a third recess formed on thesubstrate between the fifth and sixth gate electrodes; in the fourthregion, a fourth recess formed on the substrate between the seventh andeighth gate electrodes; a third epitaxial source/drain filling the thirdrecess; and a fourth epitaxial source/drain filling the fourth recess,wherein an upper surface of the third epitaxial source/drain is at aheight equal to an upper surface of the fourth epitaxial source/drain.9. The semiconductor device of claim 8, wherein the third and fourthregions are PMOS regions.
 10. The semiconductor device of claim 8,wherein the uppermost portion of the upper surface of the firstepitaxial source/drain is higher than an upper surface of the thirdepitaxial source/drain.
 11. The semiconductor device of claim 8, whereinthe lowermost portion of the upper surface of the second epitaxialsource/drain is lower than an upper surface of the fourth epitaxialsource/drain.
 12. The semiconductor device of claim 1, wherein thesubstrate further comprises a fifth region, and the semiconductor devicefurther comprises: in the fifth region, ninth and tenth gate electrodesextending parallel to each other on the substrate, and being spacedapart from each other by a third distance which is greater than thefirst distance and less than the second distance; in the fifth region, afifth recess formed on the substrate between the ninth and tenth gateelectrodes; and a fifth epitaxial source/drain filling the fifth recess,wherein the upper surface of the first epitaxial source/drain does notcomprise a concave portion.
 13. The semiconductor device of claim 12,wherein the upper surface of the first epitaxial source/drain comprisesa convex portion, and wherein the upper surface of the second epitaxialsource/drain comprises a concave portion.
 14. semiconductor device,comprising: a substrate comprising first to fourth regions; in the firstregion, first and second gate electrodes extending parallel to eachother on the substrate, and being spaced apart from each other by afirst distance; in the second region, third and fourth gate electrodesextending parallel to each other on the substrate, and being spacedapart from each other by a second distance which is different from thefirst distance; in the third region, fifth and sixth gate electrodesextending parallel to each other on the substrate, and being spacedapart from each other by the first distance; in the fourth region,seventh and eighth gate electrodes extending parallel to each other onthe substrate, and being spaced apart from each other by the seconddistance; in the first region, a first recess formed on the substratebetween the first and second gate electrodes; in the second region, asecond recess formed on the substrate between the third and fourth gateelectrodes; in the third region, a third recess formed on the substratebetween the fifth and sixth gate electrodes; in the fourth region, afourth recess formed on the substrate between the seventh and eighthgate electrodes; and first to fourth epitaxial source/drains filling thefirst to fourth recesses, respectively, wherein heights of uppersurfaces of the first and second epitaxial source/drains are differentfrom each other, and heights of upper surfaces of the third and fourthepitaxial source/drains are equal to each other.
 15. The semiconductordevice of claim 14, wherein the second distance is greater than thefirst distance, and wherein an upper surface of the first epitaxialsource/drain is higher than an upper surface of the second epitaxialsource/drain.
 16. The semiconductor device of claim 14, wherein thefirst and second regions are NMOS regions, and the third and fourthregions are PMOS regions.
 17. The semiconductor device of claim 14,further comprising: in the first to fourth regions, first to fourthfin-type patterns protruding from the substrate, wherein the first andsecond gate electrodes intersect the first fin-type pattern, wherein thethird and fourth gate electrodes intersect the second fin-type pattern,wherein the fifth and sixth gate electrodes intersect the third fin-typepattern, and wherein the seventh and eighth gate electrodes intersectthe fourth fin-type pattern.
 18. The semiconductor device of claim 14,wherein the upper surface of the second epitaxial source/drain comprisesa concave portion.
 19. The semiconductor device of claim 18, wherein theupper surface of the first epitaxial source/drain comprises a convexportion.
 20. A semiconductor device, comprising: a substrate comprisingfirst and second regions; in the first and second regions, first andsecond fin-type patterns protruding from the substrate, respectively; afirst gate electrode intersecting the first fin-type pattern on thefirst fin-type pattern; a second gate electrode intersecting the secondfin-type pattern on the second fin-type pattern; a first epitaxialsource/drain formed on either side of the first gate electrode; and asecond epitaxial source/drain formed on either side of the second gateelectrode, wherein a width of the first epitaxial source/drain is lessthan that of the second epitaxial source/drain, and an upper surface ofthe first epitaxial source/drain is higher than an upper surface of thesecond epitaxial source/drain.